Abstract: The single event upset (SEU) in integrated circuit (IC) occurs due to the striking of heavy charged particles. It results in the multiple node upset (MNU) problem frequently, with the ...
Abstract: Federated Learning (FL) has attracted the interest of researchers since it hinders inefficient resource utilization by developing a global learning model based on local model parameters (LMP ...
A critical sandbox escape vulnerability has been disclosed in the popular vm2 Node.js library that, if successfully exploited, could allow attackers to run arbitrary code on the underlying operating ...
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