Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

To enable more accurate estimation of connectivity, we propose a data-driven and theoretically grounded framework for optimally designing perturbation inputs, based on formulating the neural model as ...

Choosing a Tinder profile picture may feel like a free, personal and creative act. But how true is that? A new study from the Universitat Oberta de Catalunya (UOC) shows that, far from being unique, ...