Today’s test engineers face unprecedented demands as semiconductor designs grow more complex and product cycles accelerate. Advanced packaging, chiplet architectures, and AI accelerators are reshaping ...
Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
In an attempt to reduce the benchtop's confusing complexity, things are beginning to change. The latest test-bench instruments combine many, if not most, of the functions found in several stand-alone ...
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