Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...
Interesting Engineering on MSN
The uncomfortable truth behind the hype around 2D semiconductor performance
For almost two decades, scientists have been trying to move beyond silicon, the material ...
WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...
Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Engineers are starting to build hardware that does not just run artificial intelligence, it behaves like a primitive form of it. Instead of long chains of conventional transistors, researchers are ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results