As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...
As a digital designer, you probably recognize the benefits of using boundary-scan circuits that comply with the IEEE 1149.1 standard. But you can run into difficulty when your circuits involve using ...
Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...
Bigger designs with hundred of cores are creating an explosion in the volume of scan test data, significantly bumping up the amount of time spent on test. That raises the cost of test, forcing ...
Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...
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