Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...

Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

Something that probably unites many Hackaday readers is an idle pursuit of browsing AliExpress for new pieces of tech. Perhaps it’s something akin to social media doomscrolling without the induced ...

Download this article in PDF format. Jacques and Pierre Curie, French physics, discovered the piezoelectric effect in 1880. When some solid material is mechanically compressed or stressed, the ...

Quantitative characterization of nanomechanical properties has invariably been a holy grail for atomic force microscopy. This article explains some of the industry’s earlier attempts made at ...

This file type includes high resolution graphics and schematics when applicable. Generating a high-frequency magnetic field can be quite a challenge due to an assortment of technical issues. At high ...