Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...

As supply voltages get lower it becomes more of a challenge to accurately measure power supply ripple, or “noise,” on the power bus. Complicating factors include faster-switching power converters, ...

An oscilloscope and a device under test (DUT) constitute a de-facto system. In it, the most overlooked element is the interface between the two: the oscilloscope’s probes. Test personnel simply grab ...

Read the introduction to this series in Part 1, and the conclusion in Part 3, which covers stability. This is Part 2 of a three-part series which discusses how to properly test a DC/DC power supply to ...