Read more Test Ideas and Design Ideas here. As ICs increase in complexity and decrease in size, their pin counts drop or, at best, remain constant. The result: a need for pin-saving measures like ...
A version of Part 1 appeared in the Dec. 2011/Jan. 2012 issue of Test & Measurement World. See the PDF. In January 1979, Electronic Test published an article claiming that a single test circuit that ...
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