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TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
var FO = { movie:"http://www.the-scientist.com/supplementary/flash/test/ball.swf", width:"550", height:"200", majorversion:"8", build:"0", xi:"true"}; UFO.create(FO ...
Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...
The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
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