An international team led by researchers at MPI-CPfS used irradiation with extremely high-energy electrons to controllably introduce atomic defects in superconducting nickelate thin films. Their ...

The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...

Nanoindenters are precise, adaptable, and user-friendly tools for performing nanoscale mechanical testing on various films and surfaces. Nanoindentation systems with electromagnetic actuation achieve ...

Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology. (Nanowerk News) Materials scientists at the ...

Product Briefing Outline: i2S LineScan, Inc., a supplier of on-line and off-line camera based vision systems for optical defect detection and feature metrology, is introducing a thin film photovoltaic ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

This study constitutes a demonstration of highly textured, large-area perovskite photodiodes integrated sturdily onto FTO substrates and paves. CHENGDU, SICHUAN ...