Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

One of the easiest ways to test an engine's health is by checking its compression. Testing compression isn't something the average muscle car owner would do every year, but it is a useful tool to ...

Test compression has quickly moved from a luxury item for leading edge companies to a necessity for much of the mainstream market. This is because semiconductor companies manufacturing designs at ...

Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Mission-critical applications within markets such as transportation and medical devices require higher overall manufacturing test quality, but that often means more test patterns, data volume, and ...

Design automation is the key to the development of very large ICs. Optimizing the connection and layout of millions of gates to efficiently perform complex functions is not a job to which humans are ...

Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...